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Listings for Metrology (12)

SSM 490i Mercury Probe System (Solid State Measurements)

SSM 490i Mercury Probe System (Solid State Measurements)

| | May 2, 2012

SSM 490i Mercury Probe System (Solid State Measurements Inc.) CV System.

KLA-Tencor UV1280

| | January 10, 2012

KLA Tencor UV1280 Film Thickness Tool. Tool is complete. Good condition. Contact us for pics and additional information.

Tencor Surfscan 4000

Tencor Surfscan 4000

| | September 1, 2011

4"-6" non-patterned particle measurement. Defect Sensitivity 0.360 micron. Available operational/tested or fully refurbished.

Nanometrics 50-2C CD Measurement

Nanometrics 50-2C CD Measurement

| | July 27, 2011

Scanning photometric microscope for measuring line widths, gaps and registration alignment. Measuring range is 0.5 to 125.0 microns. Stage X-Y movement: 4" x 4".

Nanometrics NanoSpec AFT 180 or 181

Nanometrics NanoSpec AFT 180 or 181

| | July 27, 2011

NanoSpec 180 5" wafers & below. NanoSpec 181 6" wafers & below. Oxide, Nitride, Poly, etc. film thickness. 400Å-40,000Å 480-790nm WE CARRY MOST PA...

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Nanometrics Nanoline 50 – CD Measurment

| | June 15, 2011

- 10x, 50x, & 100x Objectives - 10x eyepieces - Operations & Maintenance manuals. - 4" & 5" wafer chuck.

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Therma-wave OptiProbe 5340C 300mm

| | March 31, 2011

- Complex Thin Film Thickness Measurement - 65nm IC Production Accuracy - 300mm, 200mm, & 150mm Wafers - Win NT - Software Version 4.1a14 - t, k, n Match...

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KLA 2132 or 2133

| | March 31, 2011

- Patterned Wafer Overlay Inspection Tool - Vintage: 1997 - Able to communicate with KLA 2552 - Currently set up for 8" wafers - 6" conversion available - ...

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KLA-Tencor Prometrix RS55 Resitivity 8″

| | March 29, 2011

Surface Resistivity MeasurementOmni-Map Rev. 6.51 Software with StatTrax 8″-wafer or below sample size 2Gb Iomega Drive extra data storage Calibrated (and NIST trace...

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KLA-Tencor Prometrix RS35c Resitivity 8″ Tool

| | March 29, 2011

Surface Resistivity Measurement Omni-Map Rev. 6.30 Software with StatTrax Contour Mapping 8″-wafer or below sample size Calibrated (and NIST traceable) range from 0....

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KLA-Tencor SP1 Classic 300mm (or 200mm)

| | March 25, 2011

- High Resolution Non-Patterned Surface Particle Measurement - 150wph/200mm & 100wph/300mm Throughput/Wafer - 0.08µm sensitivity on well-polished Silicon @9...

Tencor m-gage 300

| | May 20, 2012

Tencor m-gage 300. Powers up fine.

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