For Sale @ SEMI.ME Classifieds » Metrology http://semi.me Semiconductor Manufacturing Equipment - Classifieds Thu, 17 May 2012 22:29:50 +0000 en hourly 1 http://wordpress.org/?v=3.3.2 SSM 490i Mercury Probe System (Solid State Measurements) http://semi.me/ads/ssm-490i-mercury-probe-system-solid-state-measurements/ http://semi.me/ads/ssm-490i-mercury-probe-system-solid-state-measurements/#comments Wed, 02 May 2012 18:26:55 +0000 gSEMI http://semi.me/?post_type=ad_listing&p=' SSM 490i Mercury Probe System (Solid State Measurements Inc.) CV System.

]]> http://semi.me/ads/ssm-490i-mercury-probe-system-solid-state-measurements/feed/ 0 KLA-Tencor UV1280 http://semi.me/ads/uv1280/ http://semi.me/ads/uv1280/#comments Wed, 11 Jan 2012 03:28:37 +0000 sourceprocess http://semi.me/?post_type=ad_listing&p=1719 KLA Tencor UV1280 Film Thickness Tool. Tool is complete. Good condition. Contact us for pics and additional information.

]]> http://semi.me/ads/uv1280/feed/ 0 Tencor Surfscan 4000 http://semi.me/ads/tencor-surfscan-4000/ http://semi.me/ads/tencor-surfscan-4000/#comments Fri, 02 Sep 2011 03:16:49 +0000 gSEMI http://semi.me/?post_type=ad_listing&p=1168 4″-6″ non-patterned particle measurement.
Defect Sensitivity 0.360 micron.
Available operational/tested or fully refurbished.

]]> http://semi.me/ads/tencor-surfscan-4000/feed/ 0 Nanometrics 50-2C CD Measurement http://semi.me/ads/nanometrics-50-2c-cd-measurement/ http://semi.me/ads/nanometrics-50-2c-cd-measurement/#comments Thu, 28 Jul 2011 02:12:02 +0000 Cal Semi http://semi.me/?post_type=ad_listing&p=962 Scanning photometric microscope for measuring line widths, gaps and registration alignment. Measuring range is 0.5 to 125.0 microns. Stage X-Y movement: 4″ x 4″.

]]> http://semi.me/ads/nanometrics-50-2c-cd-measurement/feed/ 0 Nanometrics NanoSpec AFT 180 or 181 http://semi.me/ads/nanometrics-nanospec-aft-180-or-181/ http://semi.me/ads/nanometrics-nanospec-aft-180-or-181/#comments Wed, 27 Jul 2011 19:08:58 +0000 Cal Semi http://semi.me/?post_type=ad_listing&p=957 NanoSpec 180 5″ wafers & below.
NanoSpec 181 6″ wafers & below.

Oxide, Nitride, Poly, etc. film thickness.
400Å-40,000Å
480-790nm

WE CARRY MOST PARTS FOR THESE SYSTEMS AS WELL

]]> http://semi.me/ads/nanometrics-nanospec-aft-180-or-181/feed/ 0 Nanometrics Nanoline 50 – CD Measurment http://semi.me/ads/nanometrics-nanoline-50-cd-measurment/ http://semi.me/ads/nanometrics-nanoline-50-cd-measurment/#comments Wed, 15 Jun 2011 22:27:59 +0000 gSEMI http://semi.me/ads/nanometrics-nanoline-50-cd-measurment/ - 10x, 50x, & 100x Objectives
- 10x eyepieces
- Operations & Maintenance manuals.
- 4″ & 5″ wafer chuck.

]]> http://semi.me/ads/nanometrics-nanoline-50-cd-measurment/feed/ 0 Therma-wave OptiProbe 5340C 300mm http://semi.me/ads/therma-wave-optiprobe-5340c-300mm/ http://semi.me/ads/therma-wave-optiprobe-5340c-300mm/#comments Thu, 31 Mar 2011 18:08:57 +0000 gSEMI http://semi.me/ads/therma-wave-optiprobe-5340c-300mm/ 

- Complex Thin Film Thickness Measurement
- 65nm IC Production Accuracy
- 300mm, 200mm, & 150mm Wafers
- Win NT
- Software Version 4.1a14
- t, k, n Matching of Complex Films
- Cognex Pattern Recognition
- BPR: Beam Profile Reflectometry
- BPE: Beam Profile Ellipsometry
- DUV: Deep Ultra-Violet Broad-Band Reflectometer
- AE: Absolute Ellipsometer
- SE: Spectroscopic Ellipsometer

 

]]> http://semi.me/ads/therma-wave-optiprobe-5340c-300mm/feed/ 0 KLA 2132 or 2133 http://semi.me/ads/kla-2132-or-2133/ http://semi.me/ads/kla-2132-or-2133/#comments Thu, 31 Mar 2011 18:07:12 +0000 gSEMI http://semi.me/ads/kla-2132-or-2133/

- Patterned Wafer Overlay Inspection Tool
- Vintage: 1997
- Able to communicate with KLA 2552
- Currently set up for 8″ wafers
- 6″ conversion available
- Sensitivity >0.25µm pixels
- 2133 doubles scan speed when at 0.62pixels
- Segmented Auto Threshold (SAT)
- 8″ DSW calibration wafer included
- Power Line Conditioner Included
- Machine pictured is not of actual tool for sale


- Available Operational-Calibrated or Refurbished
- Preventive Maintenance Contract Available
- Installation Service Available

 

]]> http://semi.me/ads/kla-2132-or-2133/feed/ 0 KLA-Tencor Prometrix RS55 Resitivity 8″ http://semi.me/ads/kla-tencor-prometrix-rs55-resitivity-8-tool/ http://semi.me/ads/kla-tencor-prometrix-rs55-resitivity-8-tool/#comments Tue, 29 Mar 2011 03:05:25 +0000 SEMI.ME Consign http://semi.me/ads/kla-tencor-prometrix-rs55-resitivity-8-tool/ Surface Resistivity MeasurementOmni-Map Rev. 6.51 Software with StatTrax 8″-wafer or below sample size 2Gb Iomega Drive extra data storage Calibrated (and NIST traceable) range from 0.005Ω to 5MΩRe-painted with new chuck. TC option available for $3K.

]]> http://semi.me/ads/kla-tencor-prometrix-rs55-resitivity-8-tool/feed/ 0